Kandou contributes to new Electrical Interfaces and Metrics OCP white paper
The harmonized and up-to-date reporting of the electrical interfaces and metrics is the subject of a new Open Compute Project white paper, which Kandou and a number of industry experts have co-author.
Kandou’s Director of Standards, Majid Foodeei, as well as Kandou’s VP of Advanced R&D , Armin Tajalli, contributed to the comprehensive and up-to-date new paper, which aims to establish a unified framework for measuring and standardizing the benchmarking of performance and functionality parameters of PHY IP.
PHY IP (Electrical Interface Physical Layer Intellectual Property) is crucial for enabling seamless data exchange in modern electronic systems across interfaces like BoW, UCIe, PCIe, and Ethernet. The growing demand for high-speed, low-power, and versatile PHY IPs highlights their importance in developing advanced electronic systems for a range of applications.
Using a standardized language is essential to enabling an objective benchmarking of performance metrics for various electrical interfaces. It is a valuable resource for anyone trying to navigate the many standards, techniques, and trade-offs in electrical interfaces, which continue to evolve rapidly.
Standardization is essential for ensuring interoperability, simplifying integration, enabling compatibility, promoting quality assurance, reducing development time, fostering industry collaboration, and ensuring regulatory compliance. In reality, besides standards such as UCIe, OCP BoW, and the newly unveiled UALink standard, a number of proprietary interfaces such as Nvidia’s NVLink, continue to dominate the market place and set a high performance bar. The white paper framework takes both standard and proprietary interfaces into consideration. Kandou’s die-to-die Chord electrical interface, part of OIF CEI-5 standard specification, is also considered.
Entitled, ‘Electrical Interfaces Performance Metrics’, the white paper uses a standardized language to enable objective benchmarking of performance metrics for electrical interfaces and will now act as a resource for anyone trying to navigate this rapidly evolving area.
The white paper exemplifies the persistent and collaborative efforts of the OCP community. Well done and thank you to Majid, Armin, and all the contributors from the OCP community. You can read the OCP white paper in full here.
Credits:
Shahab Ardalan (Enosemi) Kevin Donnelly (Eliyan Corporation) James Wong (Palo Alto Electron, Inc.) Marc Greenberg (Blue Cheetah Analog Design, Inc.) Boon Chong Ang (Intel) Majid Foodeei (Kandou) Ahmad Tavakoli (Yorchip) Anu Ramamurthy (Microchip) Armin Tajalli (Kandou) Bapi Vinnakota (OCP) Cli Grossner (OCP) Elad Alon (Blue Cheetah Analog Design, Inc.) Keivan Khasraghi (Synopsys) Kevin Yee (Samsung) Madhumita Sanyal (Synopsys) Quinn Jacobson (CMU) Trent Uehling (NXP) Greg Taylor (Greg Taylor Consulting)